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Using broadband spectroscopic ellipsometry, the authors determine the complex valued dielectric function of silver films from 0. 05 eV (=25) to 4. 14 eV (= 300 nm) with a statistical uncertainty of less than 1%. While several previous similar measurements exist, they span considerably shorter energy ranges and report partially inconsistent results. In view of the wide-ranging applications of silver in nanophotonics, plasmonics and optical metamaterials, we anticipate this paper to become a standard reference for many scientists and engineers.
Yang et al. (Mon,) studied this question.
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