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April 11, 2026ACS Applied Materials & Interfaces2 citations

Reliable WSe 2 Memristors Enabled by van der Waals Electrode Integration for Advanced Reservoir Computing and Nociceptive Receptors

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YBYujie BaiYKYuhao KongSLSiling Liu

Key Points

  • The aim is to enhance the reliability and performance of memristors for neuromorphic computing using van der Waals electrode integration.
  • Synthesize high-quality monolayer WSe2 single crystals using bidirectional-flow physical vapor deposition.
  • Construct Ag/WSe2/Ag memristors with a damage-free van der Waals electrode integration process.
  • Evaluate switching consistency and operational endurance of the fabricated devices.
  • Test device performance on standard data sets for recognition tasks.
  • Achieved a low coefficient of variation (Cv) of 2.62% indicating high switching consistency.
  • Demonstrated a high memory window exceeding 10^6 and a low High Resistance State current below 10 pA.
  • Showed robust endurance exceeding 10^5 cycles during operation.
  • Attained recognition accuracies of 99.51% for MNIST and 95.39% for Fashion-MNIST data sets.

Abstract

Memristors based on two-dimensional (2D) materials are pivotal for next-generation neuromorphic hardware, owing to their high integration density, flexibility, excellent electrical properties, and advantage in neuromorphic computing. However, practical deployment is often thwarted by substantial switching variability and limited endurance, primarily arising from uncontrollable interfacial damage and energetic metal-ion diffusion during conventional electrode deposition. Herein, high-quality monolayer WSe2 single crystals are synthesized via bidirectional-flow physical vapor deposition (PVD). Subsequently, Ag/WSe2/Ag memristors are constructed using a damage-free van der Waals (vdW) metal integration process to preserve the intrinsic lattice integrity. The fabricated vdW devices exhibit remarkable switching consistency with a coefficient of variation (Cv) of only 2.62%, a high memory window exceeding 106, a low High Resistance State (HRS) current below 10 pA, and robust endurance exceeding 105 cycles. Beyond emulating fundamental synaptic behaviors, the devices achieve high-fidelity recognition accuracies of 99.51% for the Modified National Institute of Standards and Technology (MNIST) and 95.39% for the Fashion-MNIST data sets, respectively. Furthermore, biorealistic nociceptive functionalities, such as threshold firing and sensitization, are successfully emulated. This work demonstrates that vdW electrode integration is a robust paradigm for enhancing the reliability of 2D memristors, paving the way for robust high-performance neuromorphic intelligence hardware.

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Cite This Study

Bai et al. (2026) studied this question.

synapsesocial.com/papers/69d9e47378050d08c1b7510ehttps://doi.org/10.1021/acsami.6c01554
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