Creep and electrical resistivity of metallic glass Ni78B14Si8 under proton irradiation

Plastic deformation and electrical resisitivity of the metallic glass Ni78B14Si8 were measured during 6.3 MeV proton irradiation at ≈420 K under tensile stresses up to 430 MPa. Irradiation creep rate depended linearly on stress σ and particle flux Φ (or displacement rate K), giving ε*/σΦ≈4.5×10−33 m2/Pa (ε*/σK≈5×10−9 Pa−1 dpa−1). After recrystallization this value was reduced by a factor of ≈25, falling into the range of polycrystalline pure nickel and dilute Ni alloys. The electrical resisitivity in the amorphous state was decreasing under irradiation, while the initially lower resistivity of recrystallized material strongly increased.