August 20, 2001Applied Physics Letters1,270 citations
Reliability and current carrying capacity of carbon nanotubes
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Abstract
The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (109 A/cm2) show that no observable failure in the nanotube structure and no measurable change in the resistance are detected at temperatures up to 250 °C and for time scales up to 2 weeks. Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.
Cite This Study
Wei et al. (2001) studied this question.