An optical evaluation technique is described that is suitable for determining the positions and magnitudes of reflection sites within miniature optical assemblies. This method utilizes the coherence effects exhibited by a broadband optical source and is referred to as optical coherence-domain reflectometry. Background theory is given, and experimental results have demonstrated a resolution of 10 microm with an optical dynamic range of more than 100 dB.
Youngquist et al. (1987) studied this question.