Abstract This study clarifies the utility of circularly polarized luminescence (CPL) measurements under reflection-mode 90° (excitation–detection configuration) geometry photoexcitation in solid thin films. The angular dependence of the CPL spectra was investigated for a chiral perylene diimide luminophore dispersed in a poly(methyl methacrylate) film by varying the sample detector angle with respect to the detector. Clear and reproducible CPL signals were observed between 15° and 75°. This response originated from the chirality of the luminescent material. Such measurements enable reliable evaluation of thin-film samples.
Suzuki et al. (Thu,) studied this question.