Record Charge Carrier Diffusion Length in Colloidal Quantum Dot Solids via Mutual Dot‐To‐Dot Surface Passivation

Through a combination of chemical and mutual dot-to-dot surface passivation, high-quality colloidal quantum dot solids are fabricated. The joint passivation techniques lead to a record diffusion length for colloidal quantum dots of 230 ± 20 nm. The technique is applied to create thick photovoltaic devices that exhibit high current density without losing fill factor.