The absorption edge spectrum of thin films of SnO2 has been obtained at room temperature using unpolarized light. The dependence of the absorption coefficient upon film resistivity has been noted and an impurity peak at about 3.4 eV has been observed. The measurements suggest an indirect edge near 2.7 eV and a direct edge near 4.3 eV.
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W. Spence (1967) studied this question.
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