The effect of soft X-ray radiation under ultrahigh vacuum conditions on the chemical composition and surface structure of R(C2F4)nR (R = –CCl3 or Cl) tetrafluoroethylene telomers synthesized by radiation-initiated telomerization has been studied by IR spectroscopy and X-ray photoelectron spectroscopy (XPS). It has been found that irradiation leads to telomer degradation, which is evident from a decrease in the fluorine and chlorine content in the near-surface layer and the loss of –CCl3 terminal groups. Analysis of the C1s spectra has revealed a decrease in the intensity of peaks characteristic of CF2 and CF groups and an increase in the content of components responsible for the formation of crosslinks (CCFx) and hydrocarbon moieties (C–C). It has been shown that the degradation rate depends on the telomer chain length: the samples with a higher molecular mass exhibit a higher radiation resistance. The data obtained are important for understanding the radiation-induced degradation of fluoropolymers and using them under radiation exposure conditions.
Kabachkov et al. (Wed,) studied this question.
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