In Situ X-ray Diffraction during Forced Silking of Spider Silk

ADVERTISEMENT RETURN TO ISSUEPREVCommunication to the...Communication to the EditorNEXTIn Situ X-ray Diffraction during Forced Silking of Spider SilkChristian Riekel, Martin Müller, and Fritz VollrathView Author Information European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France Department of Zoology, University of Aarhus, Universitetsparken B135, DK 8000, Aarhus C, Denmark Cite this: Macromolecules 1999, 32, 13, 4464–4466Publication Date (Web):June 9, 1999Publication History Received20 January 1999Published online9 June 1999Published inissue 1 June 1999https://pubs.acs.org/doi/10.1021/ma990067ahttps://doi.org/10.1021/ma990067arapid-communicationACS PublicationsCopyright © 1999 American Chemical SocietyRequest reuse permissionsArticle Views692Altmetric-Citations76LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Biomimetic materials,Fibers,Lattices,Physical and chemical processes,X-rays Get e-Alerts