Non-parametric Statistical Characterization of Electrical Characteristics in Nanoscale Conductive Filament Devices

Key Points

• The aim is to statistically characterize the electrical properties of various nanoscale conductive filament devices.
• Analyzed 3,000 data points from 174 devices, including silver, copper, nickel, cobalt, and VCM types.
• Employed non-parametric statistical methods to evaluate electrical characteristics.
• Identified significant differences in electrical properties among filament materials.
• Found evidence suggesting the influence of quantum effects on device performance.