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May 4, 2026SHILAP Revista de lepidopterología0 citationsOpen Access

Is the hyperscaling relation violated below the upper critical dimension in some particular cases?

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DHDiep H.T.NVNgo Van-Thanh

Key Points

  • This review aims to examine the critical exponents of thin films and their adherence to the hyperscaling relation.
  • Utilized high-performance multi-histogram Monte Carlo simulations.
  • Applied free boundary conditions in the thickness (z) direction and periodic conditions in the xy plane.
  • Analyzed crossover between first- and second-order transitions while varying film thickness.
  • Critical exponents do not comply with the hyperscaling relation in thin films.
  • Evidence of crossover between first- and second-order transitions was observed as film thickness decreased.
  • In systems with multiple order parameters and the 3D Ising model coupled to lattice vibration, hyperscaling is violated.

Abstract

In this paper, we review our recent results on the critical exponents of thin films obtained by high-performance multi-histogram Monte Carlo simulations. This review shows that the critical exponents do not satisfy the hyperscaling relation. The film thickness Nz consists of a few layers up to a dozen of layers in the z direction. The free boundary condition is applied in this direction while in the xy plane periodic boundary conditions are used. We also show the cross-over between the first- and second-order transition while decreasing the film thickness in a frustrated thin film. In the third case, we show evidence that when a 2D system has two order parameters of different symmetries, the critical exponents break the hyperscaling. The last case is the 3D Ising model coupled to the lattice vibration: the results also suggest the violation of the hyperscaling.

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Cite This Study

H.T. et al. (2026) studied this question.

synapsesocial.com/papers/69f836aa3ed186a739980e29https://doi.org/10.1051/epjconf/202636601005
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