Demonstrates improved interfacial bonding in composite materials, indicating significant enhancements in mechanical stability.
Heterogeneous composite materials are widely used in microelectronic, optoelectronic, and flexible devices, yet their reliability is often limited by insufficient interfacial bonding strength and thermal mismatch–induced failure.Here, a generally applicable interfacial enhancement strategy based on microsphere self-assembly mask etching is proposed, in which ordered micro–nano structure arrays are constructed on substrate surfaces to simultaneously improve interfacial mechanical properties and thermal stability.By combining periodic microsphere self-assembled masks with dry etching, structurally consistent micro–nano architectures can be rapidly fabricated on both inorganic and polymer substrates without high-temperature processing.Representative systems including Cu/SiO₂, Cu/poly(methyl methacrylate) (PMMA), and indium tin oxide (ITO)/PMMA are systematically investigated using nano-scratch, micro-scratch, pull-off, and thermal shock tests.The results show that the micro–nano structures significantly enhance interfacial bonding by increasing the effective contact area and inducing strong mechanical interlocking.For the Cu/SiO₂ system, nanoscale Cu coatings remain intact without delamination under an 80 mN load, while the critical failure load of microscale coatings increases from 6.53 N to 16.62 N.In the Cu/PMMA system, nano-scratch tests reveal an increase in interfacial failure load from 5.53 mN to 45.05 mN, accompanied by a transition from interfacial delamination to coupled coating damage and substrate structural collapse, and the pull-off bonding strength of microscale coatings is further improved by ~49%.Moreover, the micro–nano structures effectively suppress cracking and wrinkling of ITO coatings on PMMA under thermal shock conditions up to 80 °C.This work provides a simple, low-damage, and broadly applicable route for strengthening heterogeneous interfaces and improving thermal reliability in advanced electronic and flexible systems.
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Wang et al. (2026) studied this question.
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