were used for validation. A Johnson-Cook type strain rate sensitivity model could successfully capture the strain rate hardening response of both cell types. Finite element models were developed for each cell type and empirical linear relationships were found between failure strain and strain rate. For the case of pouch cells, this correlation was negative, whilst there was a positive correlation for elliptical cells. The FE models closely followed the experiments in terms of load-displacement behavior and predicted the peak load and punch displacement at the onset of short circuit with good accuracy.
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Kermani et al. (2019) studied this question.
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