Front Cover In article number e02344, Ievgen S. Donskyi, Vasile-Dan Hodoroaba, and co-workers present a straightforward correlative imaging approach for locating graphene flakes and impurities on the nanoscale within an ink as a highly complex matrix. A systematic comparison of different surface imaging methods demonstrates that the combination of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning electron microscopy (SEM) provides the most effective strategy for visualizing and identifying these features, helping to shed light in the dark.
Schusterbauer et al. (Fri,) studied this question.