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A novel solid-electrolyte nonvolatile switch that we previously developed for programmable large-scale-integration circuits turns on or off when a conducting Cu bridge is formed or dissolved in the solid electrolyte. Cu + ion migration and an electrochemical reaction are involved in the switching process. For logic applications, we need to adjust its turn-on voltage ( V ON ), which was too small to maintain the conductance state during logic operations. In this paper, we clarified that V ON is mainly affected by the rate of Cu + ion migration in the solid electrolyte. Considering the relationship between the migration rate and V ON , we replaced the former electrolyte, Cu 2-alpha S, with Ta 2 O 5 , which enabled us to appropriately adjust V ON with a smaller Cu + ion diffusion coefficient.
Banno et al. (Sat,) studied this question.