Regeneration of LeTID degradation in p‐ PERC photovoltaic modules using DC bias

This study systematically investigates the regeneration of light‐ and elevated‐temperature‐induced degradation (LeTID) in p‐type PERC photovoltaic mini‐modules using DC bias under dark conditions. LeTID degradation was induced under 1 sun illumination at 85°C, followed by regeneration using forward and reverse DC bias in the dark. Under forward bias ( I = 0.454 A, V = 2.8 V) for 13 h, the short‐circuit current density ( J sc ) recovered from 88.72% to 96.0%, while the open‐circuit voltage ( V oc ) recovered to approximately 100.0% of its initial value. The efficiency ( η ) and maximum power ( P mpp ) also showed substantial recovery. Under reverse bias ( V = V oc ) for 15 h, J sc recovered from 88.98% to 94.7%, with corresponding improvements in the other photovoltaic parameters. The results indicate that forward‐bias regeneration is primarily driven by excess carrier injection, whereas reverse‐bias recovery suggests the involvement of electric‐field‐assisted mechanisms. Overall, this work demonstrates module‐level regeneration and provides a comparative analysis of forward and reverse DC bias as practical recovery pathways for LeTID‐affected p‐PERC modules.