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The ellipsometric determination of the dielectric function of Si around the controversial 3.4 eV optical structure yields at least three critical points at 3.34, 3.41, and 3.58 eV with types M 0 , M 1 and M 0 , respectively. The exact lineshape fit of the energy‐derivative spectra shows that the M 1 ‐type singularity is modified by many‐particle effects, which can be accounted for by an admixture of M 2 ‐type lineshape.
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G. Jungk (1980) studied this question.
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