An apparatus and method for directly measuring the depth‐dependent gain and spatial resolution of turbid scintillators

PURPOSE: Turbid (powder or columnar-structured) scintillators are widely used in indirect flat panel detectors (I-FPDs) for scientific, industrial, and medical radiography. Light diffusion and absorption within these scintillators is expected to cause depth-dependent variations in their x ray conversion gain and spatial blur. These variations degrade the detective quantum efficiency of I-FPDs at all spatial frequencies. Despite their importance, there are currently no established methods for directly measuring scintillator depth effects. This work develops the instrumentation and methods to achieve this capability. METHODS: and modulation transfer function MTF(z,f). These measurements were used to calculate each screen's expected MTF(f) in an energy-integrating detector (e.g., I-FPD). Calculations were compared to presampling MTF measurements made by coupling each screen to a high-resolution CMOS image sensor (48 μm pixel) and using the slanted-edge method. RESULTS: and MTF(z,f) showed excellent agreement with slanted-edge measurements. CONCLUSIONS: The developed instrument and method enable direct measurements of the depth-dependent gain and spatial resolution of turbid scintillators. This knowledge can be used to predict, understand, and potentially improve I-FPD imaging performance.