Experimental analysis reveals defect-driven electron scattering correlates with suppressed critical temperatures in focused-ion-beam-patterned niobium films, supporting recent theoretical models.
band scattering for the Nb film. Finally, by analyzing samples with varying density of incorporated defects, the emergence of the additional contribution is correlated to a decrease in their critical temperature, in agreement with recent theoretical results.
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Valerio-Cuadros et al. (2021) studied this question.
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