A two-coil mutual-inductance apparatus that is optimized to allow for the measurement of the absolute value of penetration depth λ in superconducting films is described. Nb films with thickness d ranging from 20 to 90 nm are used to illustrate the measurement. For a 70-nm-thick Nb film at 4.2 K, with d/λ∼0.6, the uncertainty in the measured λ is about ±2.3%. From the results on the Nb film series, we show that a satisfactory determination of the absolute value of λ is possible for these films with d/λ<0.95.
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Wang et al. (1999) studied this question.
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