This paper presents the reliability prediction of four photovoltaic systems: a two-stages system, a three-stages one, and two integrated topologies, one with a boost-inverter, and the second with a buck-boost inverter. The goal is to identify the most failure prone components, and the stress factors with the highest contribution to the failure rate. In all cases, it was found that the MOSFETs are the most vulnerable components, and that the dominant stress factor is related to the temperature. It was also found that the reliability can be improved if the switching devices are overrated, but only to a certain level, and using too large MOSFET can be counterproductive
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Chan et al. (2006) studied this question.
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