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May 17, 2026Journal of Applied Physics0 citations

In Situ Characterization of Microstrip Line Using Near-Field Scanning Microwave Microscopy

In situ characterization of microstrip line using near-field scanning microwave microscopy

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Authors

MWMeidi WangCPChensi PanHCHao Cheng

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Overview

Randomized trial demonstrates the sensitivity of microwave field distributions in microstrip lines, highlighting practical implications for circuit diagnostics.

Key Points

  • The aim is to accurately characterize microwave signal propagation and field distributions in microstrip lines to ensure circuit reliability.
  • Developed a near-field scanning microwave microscopy technique with beat-frequency enhancement.
  • Maintained constant probe–sample distance and dielectric environment during characterization.
  • Measured transmission coefficient S21 to visualize field strength and optimize detection sensitivity under varied signal conditions.
  • ΔS21 shows a positive correlation with input signal power, indicating sensitivity to input changes.
  • Detection sensitivity enhanced as input signal frequency nears the probe-sample coupling resonant frequency, with a minimum detectable power of -40 dBm.
  • Surface scanning effectively visualized microwave field strength distributions, matching simulation data for normal and defective lines.
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Cite This Study

Wang et al. (2026) studied this question.

synapsesocial.com/papers/6a095c037880e6d24efe1f8bhttps://doi.org/10.1063/5.0335065
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