Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy

Aayush Nayyar; Ruizhe Yang; Vashin Gautham; Sagnik Das; Haiqing Lin; Andrew C. Antony; D. Thelen; Mayukh Nath; Gabriel Agnello; J Liu

doi:10.1021/acsami.6c02092

May 15, 2026ACS Applied Materials & Interfaces

Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy

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Key Points

The aim is to develop a method for characterizing contact electrification in ultrathin glass materials using Kelvin probe force microscopy.
Used Kelvin probe force microscopy to map contact electrification at nanoscale.
Applied external bias to AFM tips to manipulate the CE response of glass materials.
Extended characterization techniques from oxide thin films to stand-alone oxide materials.
Demonstrated precise mapping of CE at 100 μm scale.
Showed that external bias can enhance or invert CE responses.
Provided a framework for understanding electrostatic charging in glass systems.

Implication

Maps contact electrification in oxide materials, suggesting new applications in glass systems.

Abstract

at 100 μm. Additionally, the external bias applied to the AFM tips can be used to enhance, suppress, or invert the intrinsic CE response of glass materials. This work extends nanoscale CE characterization beyond oxide thin films to stand-alone oxide materials, providing a framework to understand and manipulate electrostatic charging in glass systems for practical applications.

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Cite This Study

Nayyar et al. (2026) studied this question.

synapsesocial.com/papers/6a095c2c7880e6d24efe2402 https://doi.org/10.1021/acsami.6c02092

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Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy

Key Points

Implication

Abstract

Discussion

Cite This Study

Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy

Key Points

Implication

Abstract

Discussion

Cite This Study

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