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Structured light 3D shape metrology has become a very important technique and one of the hot research topics in 3D face recognition. However, it is still very challenging to use the digital light projector (DLP) in a 3D scanner and achieve high-speed, low-cost, small-size, and infrared-illuminated measurements. Instead of using a DLP, this paper proposes to use a galvanometer scanner to project phase-shifted fringes with a projection speed of infrared fringes up to 500 fps. Moreover, the measurement accuracy of multi-frequency (hierarchical) and multi-wavelength (heterodyne) temporal phase unwrapping approaches implemented in this system is analyzed. The measurement accuracy of the two methods is better than 0.2 mm. Comparisons are made between this method and the classical DLP approach. This method can achieve a similar accuracy and repeatability compared to the classical DLP method when a face mask is measured. The experiments on real human face indicate that this proposed method can improve the field of 3D scanning applications at a lower cost.
Xue et al. (Sun,) studied this question.