In this Letter, detection/classification of defects are treated in a fuzzy way considering classes of defects to a certain depth characterized by typical ranges of fuzzy similarities. So, depth evaluation is translated in terms of comparison of similarities among signals with defectiveness located at unknown depth and the class of signals without defects. In addition, an FPGA‐based board implementing the designed procedure will be discussed. The performance gives the comparability of the results with other established techniques.
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Mario Versaci (2016) studied this question.
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