A novel approach of standard data base generation for defect detection in bare PCB

A bare PCB is PCB without any component mounted on it. PCB plays a significant role on the performance of various electronic products. So, there is requirement of fast & quantitative assessment. Since the manual inspection system is unreliable and time consuming, automatic optical inspection method is used. This paper presents an algorithm mainly having two parts, one is image enhancement and other is standard template formation. Image enhancement includes color plane extraction, LUT Transformation, Thresholding, Filtering, and Advance morphology, while Particle analysis is used for standard template generation. Particle analysis consists of various processing operations and analysis functions that produce some information about the particles in an image. Standard template can be used for referential matching of automatic defect detection. Lastly the performance meter is used which gives the response time taken during execution of different steps. The execution time taken of the proposed algorithm is 14 ms.