We study the distribution of resonance widths P(Γ) for three-dimensional (3D) random scattering media and analyze how it changes as a function of the randomness strength. We are able to identify in P(Γ) the system-inherent fingerprints of the metallic, localized, and critical regimes. Based on the properties of resonance widths, we also suggest a criterion for determining and analyzing the metal-insulator transition. Our theoretical predictions are verified numerically for the prototypical 3D tight-binding Anderson model.
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Weiß et al. (2006) studied this question.
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