The method of applying two consecutive voltage pulses is presented as a method to study the dynamics of injected charges in the “off-state,” i.e., after the removal of the applied voltage pulse. Pulses of different widths are used to selectively probe the dynamics of holes and electrons. The use of multiple (>2) pulses is also described as an additional carrier monitoring technique.
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Pinner et al. (2000) studied this question.
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