An electrode contact scheme based on the use of an organic LiF alloy is investigated. The performance of organic light emitting diodes (OLED) with this contact scheme in both heterojunction and bipolar transport/emitting layer (BTEL) OLED structures are compared with their counterparts with LiF buffer layers. The organic LiF contact scheme improved device reliability of BTEL OLEDs by 32% to 92 500 h while adversely affecting device reliability of heterojunction OLEDs.
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Choong et al. (2000) studied this question.
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