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We track individual defects in the microdomain patterns of cylinder-forming polystyrene-block-polymethylmethacrylate films with atomic force microscopy to elucidate the evolution of diblock domain topology during annealing. This evolution takes place through relinking, joining, clustering, and annihilation of defects. Such processes form the basis for predicting structural change in polymer films.
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Hahm et al. (1998) studied this question.
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