Observing Atoms at Work by Controlling Beam–Sample Interactions

Functional behavior can be initiated and captured in series of images with previously unknown details using a successful effort to effectively control beam-sample interactions in high-resolution transmission electron microscopy. The approach uses tunable electron dose rates that can be chosen to be as low as attoamperes per square-Ångstrom to delay sample degradation to an unexplored end. Dose rates can be systematically increased to stimulate and observe dynamic object responses. Observations can be made in real time with deep sub-Ångstrom resolution and single-atom sensitivity, even if radiation-sensitive matter is probed and either pressure or temperature is raised in the electron microscope.