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May 1, 1987Applied Optics371 citations

New measurement system for fault location in optical waveguide devices based on an interferometric technique

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KTK. TakadaIYI. YokohamaKCKazumori Chida

Key Points

  • The aim is to develop a new measurement system for locating faults in optical waveguide devices.
  • Developed a system using Mach-Zehnder and Michelson interferometers.
  • Achieved spatial resolution of <380 microm.
  • Conducted preliminary experiments with single-mode fibers <10 cm long.
  • Minimum detectable backscattered power was -116 dB relative to light power.
  • Spatial resolution is determined to be constrained by averaging time.

Abstract

A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is <380 microm, which is limited by the averaging time. The minimum detectable backscattered power is -116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.

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Cite This Study

Takada et al. (1987) studied this question.

synapsesocial.com/papers/6a11da1b8095bbd48eb4d1echttps://doi.org/10.1364/ao.26.001603
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