Bistable gated bipolar (BGB) devices, a novel negative differential resistance (NDR) device, is investigated in this paper. Experimental demonstration for both n-channel and p-channel devices is carried out in a partially depleted silicon-on-insulator technology. The temperature dependence of its NDR characteristics is measured and found to be in good agreement with analytical models. A feasible scheme is proposed to implement this device in scaled CMOS technologies. As the basic principle for applications, the measured hysteresis characteristic of a storage cell utilizing the BGB device is reported for the first time. Potential applications for logic and memory are also discussed
No takes yet. Share an insight, caveat, or question.
Cheng et al. (2006) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: