Thin films (t approximately 0.7 mu m thick) of ZnSxCdSe1-x (0<or=x<or=1) were formed by thermal evaporation on glass substrates kept at 300 K and 470 K. XRD studies showed that all the films were polycrystalline in nature. The wurtzite to zinc blends transition was found to take place in the composition region 0.70<or=x<or=0.75. The lattice parameters of the films formed at a higher substrate temperature were greater than those deposited at a lower substrate temperature. Optical bandgaps also increased with substrate temperature. Bandgaps varied nonlinearly with composition, showing a downward bowing. The bowing parameter decreased with substrate temperature. The structural and bandgap studies clearly indicated a complete miscibility of the ZnS-CdSe system.
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Vijayalakshmi et al. (1994) studied this question.
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