Holographic interferometry in an electron microscope and its phase analysis technique are described. The fringe scanning method is used to gain high sensitivity in phase detection. An example of measuring a magnetic field of a fine particle is presented. The measurement accuracy for median filtering is about 1/70 fringe corresponding to the magnetic flux sensitivity of 6 x 10(-17) Wb. Noise reduction techniques are also discussed.
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Yatagai et al. (1987) studied this question.
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