This research discusses the application of Monte Carlo methods for improving radiation transport simulations and rate predictions of single-event effects (SEEs) in microelectronics.
Overview of Monte Carlo methods and simulation techniques.
Applications to understand radiation effects in microelectronics.
Connection to the CARRE initiative for enhanced modeling.
Emphasis on Monte Carlo methods increasing simulation accuracy.
Highlight of the relevance to ongoing CARRE efforts in optimizing radiation predictions.
Abstract
Talk for MRQW 2026. Overview of Monte Carlo methods, their applications to radiation effects, and their relation to the CARRE effort.