There is enormous demand for high-bandwidth DRAM: in application such as HPC, graphics, high-end server and artificial intelligence. HBM DRAM was developed [1] using the advances in package technology: TSV, microbump and silicon-interposer. Owing to these advances, HBM has a much higher bandwidth, at a lower pin speed rate, than conventional DRAM. However, the 3D-stack structure causes TSV interface and PDN problems: TSV connection failure and 3D-accumulation of IR drop, which increases the total cost of HBM. Moreover, as memory bandwidth increases DRAM architectural challenges arise, power consumption and associated thermal problems increase as well.
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Lee et al. (2020) studied this question.
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