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The γ ray Compton profiles along the two major axes [100] and [110] have been measured on niobium single crystals with a pure Ge solid-state detector. The measured profiles were fully processed and compared with the theoretical profiles calculated by APW for the valence electrons and by tight-binding method for the core electrons, using the impulse approximation. As for the whole profile, the agreement between experiment and theory is fairly good, supporting the validity of the solid-state effect on 4d electrons, at least in niobium, determined by APW method and the applicability of the impulse approximation.
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Wakoh et al. (1975) studied this question.
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