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Many memory tests have been designed in the past, one class of tests which has been proven to be very efficient in terms of fault coverage as well as test time, is the class of march tests. Designing march tests is a tedious, manual task. This paper presents a method which can, given a set of fault models, automatically generate the required march tests. It has been implemented in the programming language C and shown to be effective.
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Goer et al. (2002) studied this question.
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