The situation in which test results are available on systems consisting of some of k independent but nonidentical components in series is studied. The underlying distribution of the lifetime of the component is assumed to be an exponential. The method of maximum likelihood is used to obtain estimates, a chi squared approximation is used to approximate the mean and variance of the maximum likelihood estimate, and a method for reducing its bias is presented.
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Tatsuo Miyamura (1982) studied this question.
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