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Cohen's kappa index is reformulated for multiple classifications based on exchangeable random variables. It is found that kappa is between 0 and 1 inclusive. Two characterizations for kappa are stated in terms of the relationship between such random variables. Within the normal test score model, kappa increases with test reliability and test length. Furthermore, when based on binary classifications, kappa is an inverse U-shaped function of the cutoff score. These trends also hold for the beta-binomial test score model.
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Huynh Huynh (1978) studied this question.
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