Ellipse rotation studies in laser host materials

Using a TEM <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">00q</inf> near Gaussian mode ruby laser system we report the first experimental measurements of intensity induced changes of optical polarization (ellipse rotation) in a cubic crystalline medium, YAG, for which we obtain the nonlinear susceptibilities <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">χ₃¹²²¹ (- ω, ω, ω, -ω) = 6.34 × 10⁻¹⁵</tex> ESU and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/2 (χ₃¹¹¹¹ + χ₃¹²²¹ - 2χ₃¹²¹²) = 7.18 × 10⁻¹⁵</tex> ESU, accurate to better than ±7 percent relative to <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">χ₃¹²²¹ (- ω,ω,ω, -ω)</tex> for liquid CS <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> . These values are compared with further results obtained for fused quartz and two laser glasses. Moreover, by time resolving the ellipse rotation data we demonstrate the capability to plot ellipse rotation versus input power on a single laser shot, thus increasing the practical feasibility of the technique and introducing the possibility of resolving transient contributions to the measurement.