Answers are grounded in this paper and cite their sources.
We observe the "minimum metallic conductivity," σₘ, to be a decreasing function of surface-state charge density, Qₛₛ, near the Si-SiO₂ interface. This dependence of σₘ on Qₛₛ is contrary to Mott's concept of minimum metallic conductivity, but explains the large differences in σₘ reported in the recent literature.
No takes yet. Share an insight, caveat, or question.
Tsui et al. (1975) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: