Key points are not available for this paper at this time.
We observe the "minimum metallic conductivity, " ₌, to be a decreasing function of surface-state charge density, Qₒₒ, near the Si-SiO₂ interface. This dependence of ₌ on Qₒₒ is contrary to Mott's concept of minimum metallic conductivity, but explains the large differences in ₌ reported in the recent literature.
Tsui et al. (1975) studied this question.