We report on the use of high voltage atomic force microscopy for direct measurements of the piezoelectric coefficient d33 of monodomain RbTiOPO4 ferroelectric crystal. The measurements are compared with the conventional ac voltage modulation atomic force microscopy based technique, which needs calibration of the measurement apparatus. The comparison of the two measurement methods with literature reported values is discussed.
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Agronin et al. (2003) studied this question.
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