Optical measurement of microroughness of pigment coatings on rough substrates

The optical determination of rms roughness at the sub-wavelength scale by measurement of specular intensity as a function of wavelength or angle of incidence is well known. The method is normally used for specimens that are macroscopically flat. However, important industrial materials such as coated paper and paint consist of microscopically rough pigment coatings on a macroscopically rough substrate. Numerical modelling is used to assess the applicability and limitations of optical measurement of microroughness for such materials. Experimental results are presented for a range of paints on substrates of various macroroughness. Model and data are in fair agreement and show that the presence of substrate macroroughness always leads to an underestimation of microroughness. Generally, optical measurements of microroughness are only comparable for substrates of similar macroroughness and a limiting value exists above which measurements may not be meaningful.