This article defines and demonstrates a framework for studying differential item functioning (DIF) and differential test functioning (DTF) for tests that are intended to be multidimensional The procedure introduced here is an extension of unidimensional differential functioning of items and tests (DFIT) recently developed by Raju, van der Linden, & Fleer (1995). To demonstrate the usefulness of these new indexes in a multidimensional IRT setting, two‐dimensional data were simulated with known item parameters and known DIF and DTE The DIF and DTF indexes were recovered reasonably well under various distributional differences of Os after multidimensional linking was applied to put the two sets of item parameters on a common scale. Further studies are suggested in the area of DIF/DTF for intentionally multidimensional tests.
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Oshima et al. (1997) studied this question.
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