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The authors use empirical statistical methods to obtain preliminary knowledge about the fault tolerant capabilities of a small-scale forward connected neocognitron. The research was performed in order to develop an analytical basis for neural network hardware implementation. Several new fault models are assumed: connection weights stuck at zero or random values; and element output values or connection weight values fluctuating within a certain range about the correct values. Based on these fault models, test shells were simulated to study the neocognitron fault tolerant ability during its learning phase and post-learning phase performance. The result of this study shows that the neocognitron will, to a certain extent, tolerate faults in its post-learning performance phase and ignore the faults in its learning phase. Suggestions for hardware design of the neocognitron from a fault tolerant point of view are provided.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Xu et al. (2002) studied this question.
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