An accurate large-signal MOS transistor model for use in computer-aided design

Some MOS transistor models for computer-aided design, each having a given accuracy and complexity, are presented. These models apply before saturation and in the saturation region. Before saturation, the proposed theory takes into account the behavior of mobility versus gate-channel and drain-source biases. In the saturation region the effect of mobile carriers on the drain-channel space-charge layer in an approximate two-dimensional analysis is taken into account. This model has been checked for dc characteristics <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ID (VDS)</tex> and different channel lengths, dynamic resistances in the saturation region, transfer characteristics of various inverters, and dynamic response of these circuits. The accuracy is within 5 percent.