This paper presents program pulse characterization in an 8-Mb BJT-selected phase-change memory test chip. Experimental results of the impact of the bit-line resistance over programming pulse efficiency are provided. Furthermore, in order to compensate for spreads in cell physical parameters in an array portion, a non-conventional staircase-down program pulse is proposed and experimentally evaluated.
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Bedeschi et al. (2005) studied this question.
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